The following images are roughly in chronological order. They don't
represent the best or worst we have taken, but merely the ones I happen
to have put here for one reason or another.
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This is the first successful scan we ever took. We were mostly
just surprised that an AFM we got for free off the reuse list worked
at all, I think... The vertical bumps are about 20nm tall. |
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This was taken not too long after the scan above; it's the same aluminum surface
imaged near a scratch. Gary has a
3D image of this
particular scratch.
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An image of a Si calibration grid taken in contact mode. |
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An image of a Si calibration grid taken in contact mode. The fine diagonal
stripes are some 60hz feedthrough we haven't tracked down. |
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The first non-contact image taken after the ability to move the tip
up and down seperately from the sample. It's now comparitively easy to
use the microscope for non-contact imaging. This image was taken using
phase response and large amplitude excitation (1 volt or around 3 angstroms).
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The above image with one line replaced by the average of its neighbors.
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The same region and conditions as the above scan, but at much higher resolution. This
does not show well in the thumbnail.
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A zoomed in view of the top of one of the plateaus.
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A zoomed in view of a few of the dust particles on the top of the plateau. The Z
distortion is because the scanner calibration was accidentally turned off.
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The first image we got of Cobalt dots on a sample. The image has been high pass filtered.
Forward pass
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The first image we got of Cobalt dots on a sample. The image has been high pass filtered.
Forward pass
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