Automotive Top Coat imaged with AFM and Compliance Microscopy

(left = topography, right = compliance map) Click each image for full view (48k)

NOTE: - By modulating the scanner in the Z dimension and mapping the differences in the tip movement as seen by the sensor, the Compliance of the sample shows harder particles as brighter pixels. Both images are acquired simultaneously for direct comparison and correlation to surface topographic effects.

By F. Lin, and D. J. Meier, Michigan Molecular Institute, 1910 West St. Andrews Rd., Midland, MI 48640-2696

Other Applications by MMI

Crystalline Polymers: Imaging by AFM

European Microscopy and Analysis, Jan 93

Pe-Ps cross-section

Syndiotactic Polystyrene

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