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Syndiotactic Polystyrene- Imaged in Contact AFM
NOTE: -75x75um scan, Maximum Z height of topographic data is 5027nm .
By F. Lin, and D. J. Meier, Michigan Molecular Institute, 1910 West St. Andrews Rd., Midland, MI 48640-2696
Other Applications by MMI
Crystalline Polymers: Imaging by AFM European Microscopy and Analysis, Jan 93 Pe-Ps cross-section Automotive Paint Top Coating Compliance Frictional Properties of a Coated Metal