Near-Contact image of an alumina silica glass substrate
Thermal conductivity map of exposed/unexposed photoresist
SuperTip image of Al / Si / Cu grains
SuperTip Image of Polysilicon grain structure
SuperTip image of a Tungsten Plug
Accurex CMP repeatability test. (CAREFULL CLICKING - 170Kb)
Epitaxially grown silicon, imaged in Non-contact.
Comparison of silicon wafer cleaning techniques.
GaAs Steps imaged with Observer(tm)
Integrated Circuit Logic Array
Non-contact image of silicon wafer hazing.