Cover Photo of SCANNING Vol. 15,5 (1993) Honoring Nobel Prize Winner Prof. Dr. H. Rohrer

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SCANNING Vol. 15,5 (1993) September / October Cover

Image courtesy of Prof. Dr. H.-J. Güntherodt, University of Basel

This issue honors Prof. Dr. Heini Rohrer, IBM fellow, IBM Zürich Research Laboratory. Born June 6th, 1933, Switzerland. Dr. Rohrer received his Ph.D. in experimental physics in 1960 from the Eidegenössiche Technische Hochschule (ETH) Zürich, with an emphasis in superconductivity. He joined the IBM research laboratory in Zürich in 1963, after a two-year postdoctorate at Rutgers University, New Jersey. His research interests included Kondo systems, phase transitions, and multicritical phenomena before he opened the field of scanning tunneling microscopy in 1975 together with G. Binnig. For this outstanding work Dr. Rohrer became the co-recipient of the Nobel prize in physics in 1986.

Also see the accompanying articles in the same issue:

"Scanning Probe Microscopy for Industrial Applications: Selected Examples" p. 257-264
by The STM and AFM Group (U. Dammer, Editor), D. Anselmetti, M. Dreier, J. Frommer, J. Fünfschilling, G. Gerth, H.-J. Güntherodt, H. Haefke, H.-R. Hidber, L. Howald, H.J. Hug, T.H. Jung, H.P. Lang, R. Lüthi, E. Meyer, A. Moser, I. Parashikov, P. Reimann, T. Richmond, M. Rüetschi, H. Rudin, U.D. Schwarz, U. Staufer, R. Sum
Institut für Physik der Universtät Basel, Basel, Switzerland

"Applications in SFM in the Chemical Industry" p. 275-281
M. Anders and H. Fuchs*
BASF AG, Polymer Research Laboratory, Ludwigshafen; *Physikalisches Institut, Westfälische Wilhelms-Universtät, Münster, Germany

"Topography and Performance of Gas-Sensing Devices: An AFM Study" p. 291-294
Brigitta Hacker, Maximillian Fleischer, Hans Meixner
Siemens AG, Corporate Research and Development Munich, Germany