Topography Imaging with Lateral Force and Compliance Spectroscopy

[Lateral Force and AFM Spectroscopy] [Lateral Force and AFM Spectroscopy] [Lateral Force and AFM Spectroscopy] Click image for full area. (90K)

Left=Topography, Center=Lateral Force, Right=Compliance Spectroscopy

Hard glass sample illustrating alternative imaging modes that can show surface contrast not seen from the topography scan.

NOTE: -Brighter areas in the lateral force scan reveal higher frictional forces on the surface of the specimen characterized by torsional effects on the scanning probe. Brighter areas in the lateral force mode image are the result of higher frictional forces.

The compliance (spectroscopy) image displays any variance in compliance (hardness) at various points on the sample surface. Darker areas of the compliance scan reveal softer, higher compliance areas.

The area in the lower right hand corner of the lateral and spectroscopy images may be surface contamination undetectable to the topographic scan, yet detectable by either lateral (frictional) mode or compliance spectroscopy mode scanning.


Home - Top