A Partial Listing of Publications on TopoMetrix Equipment
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Title: Non-contact versus Contact Imaging; An Atomic Force Microscopic Study on Hepatic Endothelial Cells in Vitro
Authors: F. Braet, R. DeZanger, S. Kämmer and E. Wisse
Publication: International Journal of Imaging Systems and Technology Date: 1997 - In Press
Title: Drying Cells for SEM, AFM, and TEM by Hexamethyldisilane: A Study on Hepatic Endothelial Cells
Authors: F. Braet, R. DeZanger and E. Wisse
Publication: Journal of Micrsocopy Date:1997 - In Press
Title: Near-field Confocal Optical Spectroscopy (NCOS): Sub-diffraction optical resolution for biological systems.
Authors: P.G. Haydon, S. Marchese-Ragona, T.A. Basarsky, and M. Szulczewski, and M. McCloskey
Publication: J. Microscopy (in press)
Title: Atomic Force Microscopy Observation of Cyanine Dye J-Aggregates on AgBr Microcrystals Grown in Gelatin
Authors: Hiroshi Saijo and Makoto Shiojiri
Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606, Japan
Publication: J. of Imaging Science and Tech. Vol 40, Num 2, March/April 1996
Title: Spontaneous Assembly in Organic Thin Films Spread on Aqueous Subphase
Authors: S. R. Cohen, I. Weissbuch, R. Popovitz-Biro, J. Majewski, H. P. Mauder -Weizmann Institute of Science
Publication: Israel J. Chem (in press) Date: 96
Title: Structure Imaging by Atomic Force Microscopy and Transmission Electron Microscopy of Different Light Emitting Species of Porous Silicon
Authors: R.M. Sassaki, R.A. Douglas, M.U. Kleinke and O. Teschke
Publication: J. Vac. Sci. Technol. B 14(4), Jul/Aug 1996
Title: Visualization of Nanostructured Porous Silicon by a Combination of Transmission Electron Microscopy and Atomic Force Microscopy
Authors: O. Teschke
Publication: Appl. Phys. Lett. 68(15), 8 April 1996
Title: Atomic Force and Electron Microscopy of Sporangial Wall Microfibrils in Linderina Pennispora
Authors: T.A. McKeown, S.T. Moss and E.B.G. Jones; School of Biological Sciences, Univ. of Portsmouth, Hampshire, U.K.
Publication: Mycol. Res. 100 (7), 821-826 (1996) (printed in Great Britain)
Title: The structure and dynamics of tetramethylthiourea ads on Au(111) by STM
Authors: E. Bunge, R. J. Nichols, B. Roelfs, H. Meyer and H. Baumgartel -Atotech Deutschland GmbH
Publication: Accepted by Langmuir Date: 96
Title: Ultrathin Graphite Oxide-Polyelectrolyte Composites Prepared by Self-Assembly: Transition Between Conductive and Non-Conductive States
Authors: Nicholas A. Kotov, Imre Dékány, Janos H. Fendler
Publication: Advanced Materials - Vol. 8 - No. 8 Date: Aug 1996
Title: The Development of AFM as a Failure Analysis Tool for Hard Disk Drives
Authors: A. Chekanov, T.S. Low, S.H. Soh
Publication:IDEMA Insight Date: Nov/Dec 1996
Title: Atomic Force Microscopy of Amorphous Hydrogenated Carbon-Nitrogen Films Deposited by Radio-Frequency-Plasma-Decomposition of Methane-Ammonia Gas Mixtures
Authors: R. Prioli, S.I. Zancar, A.O. Caride, D.F. Franceschini, F.L. Freire Jr.
Publication: J. Vac. Sci. Technol. A14(4) Date: Jul/Aug 1996
Title: Polystyrene Spheres on Mica substrates: AFM calibration, tip parameters and
Authors: M. Van Cleef, S. A. Holt, G. S. Watson & S. Myhra -Griffith University
Publication: Journal of Microscopy, Vol. 181 Pt 1, Jan 1996 Date: 96
Title: External and internal structure of cells: A study by afm
Authors: G. S. Watson, G. R. Bushell, and S. Myhra -Griffith University
Publication: NTA/VSA 95 Date: 95
Title: Reverse imaging by AFM: Determination of tip shape
Authors: G. S. Watson, -Griffith University
Publication: NTA/VSA 95 Date: 95
Title: Environmental degradation of YBa2Cu3O7-x thin films. Analysis by AFM
Authors: G. S. Watson, S. A. Holt, R.-P. Zhao, A. Katsaros, N Savvides, S. Myhra -Griffith University
Publication: Physica C 243 (1995) 123-133 Date: 95
Title: Aqueous degradation of Bi2212 Single Crystals: an AFM study of Surf Alt
Authors: Stephen A. Holt, Rupeng Zhao, Sverre Myhra -Griffith University
Publication: Applied Surface Science 84 (1995) 125-131 Date: 95
Title: In Situ AFM Study of the Relationship Between the Surface Morphology and Conductive Mechanism of Polypyrrol Film
Authors: Jing Li, Erkang Wang, Michael Green, and Paul West.
Publication: Synthetic Metals, 74 (1995) 127 Date: 1995
Title: Be Incorporation and Surface Morphologies in Homoepitaxial InP Films
Authors: M.A. Cotta, M.M.G. Carvalho, M.A.A. Pudenzi, K.M.I. Landers, C.F. Souza, R.L. Landers and O. Teschke
Publication: Appl. Phys. Lett. 67(8), 21 August 1995
Title: Direct observation of latent nuclear tracks in organic material by afm
Authors: N. Rozlosnik, L. Sajo Bohus, C. Birattari, E. Gadioli, L.P. Biro, K. Havanc -Eotvos University
Publication: Date: 95
Title: Microcracks of the Alumina Substrate of the Thin-Film head: Study and Simul
Authors: A. S. Chekanov, T. S. Low, S. Alli, B. Liu, B. S. Teo, S. Hu -Magnetic Technology Center
Publication: Date: Received Feb 11, 1995
Title: Scanning Force Microscopies Can Image patterned Self-Assembled Monolayers
Authors: James L. Wilbur, Hans A. Biebuyck, John C. MacDonald and George M. Whitesi -Harvard University
Publication: Langmuir 1995, 11, 825-831 Date: 95
Title: Structure of Self Assembled Decanethiol on AG(111) Molecular Resolution STM
Authors: A. Dhirani, M. A. Hines, A. J. Fisher, O. Ismail and P. Guyot-Sionnest -James Franck Institute
Publication: Langmuir 1995, 11. 2609-2614 Date: 95
Title: Sub-surface imaging by scanning thermal microscopy
Authors: A Hammiche, H. M. Pollock, M. Song and D. J. Hourston -Lancaster University
Publication: Submitted to Measurement and Science Technology Date: 95
Title: A Study of Latex Film Formation by Atomic Force Microscopy 1. A Comparison
Authors: F. Lin, D. Meier -Michigan Molecular Institute
Publication: Langmuir, Vol. 11, No. 7, 1995 Date: 95
Title: Atomic Force Magnetic Force Microscopy Imaging of Thin-Film Recording Head
Authors: W. K. Chim -National university of Singapore
Publication: Scanning Vol. 17, 306-311 (1995) Date: 95
Title: Scanning Plasmon Optical Microscope
Authors: Y-K Kim, P. M. Lundquist, J. A. Helfritch, J. M. Mikrut, G. K. Wong, ... -Northwestern University
Publication: Appl. Phys. Lett. 66 (25), 19 June 1995 Date: 95 June
Title: 104 GHz signals measured by high frequency scanning force microscope test s
Authors: C. Bohm, J. Bangert, W. Mertin, E. Kubalek -University of Duisburg
Publication: Electronics Letters 22nd June Vol. 31 No. 13 Date: June 22, 95
Title: Investigation of Depth-Area Relationships Associated with Nanoindentations
Authors: L. Riester and M. K. Ferber -Oak Ridge National laboratory
Publication: Date: 95
Title: Scanning Probe Microscope Gigahertz Measurements on 200nm Waveguides
Authors: C. Bohm, J. Sprengepiel, E. Kubalek -University of Duisburg
Publication: Scanning Microscopy Date: 95
Title: The use of atomic force microscopy in graphic arts problem solvin
Authors: Robert W. Bassemir, Gail Costello, Juanita Parris -Sun Chemical Corporation
Publication: American Laboratory Date: Nov. 95
Title: Langmuir-Blodgett Films Prepared from Ferroelectric Lead Zirconium Particle
Authors: Nicholas A. Kotov, Genaro Zavala and Janos Fendler -Syracuse University
Publication: J. Phys. Chem. 1995, 99, 12375-122378 Date: 95
Title: Using the AFM to Measure Roughness Characteristics of Acetabular Prosthetic
Authors: Shilseh Jani, Gary Williams, Silvio P. Marchese-Ragona, Briggs Christie -Smith and Nephew Richards
Publication: Microscopy Today Issue 95-3 Date: April 95
Title: Scanning Near-field optical microscopy and its applications in mineralogy
Authors: Winfried Gutmannsbauer, T. Huser, Lacoste, Heinzelmann, Guntherodt -Physikalisches Institut
Publication: Schweiz. Mineral Petrogr. Mitt 75, 259-264, 1995 Date: 95
Title: Atomic Force Microscopy Investigations on Polymer Latex Films
Authors: B. Anczykowski, L. F. Chi and H. Fuchs -Physikalisches Institut, Westfalische (Muenster)
Publication: Surface and Interface Analysis, Vol. 23, 426-425 Date: 95
Title: Scanning Thermopower Microscopy of Guanine Monolayers
Authors: J.C. Poler, R. M. Zimmerman and Edward C. Cox -Princeton
Publication: Langmuir 1995, 11, 2689-2695 Date: 95
Title: Release of Protein from a Poly Film during Srfc Erosion Std by in situ AFM
Authors: K. M. Shakesheff, M. C. Davies, J. Heller, C. J. Roberts, S. J. B. Tendler, -The University of Nottingham
Publication: Langmuir, 1995, 11. Date: 95
Title: In Situ AFM Visualization of the Degradation of Melt-Crystallized Poly
Authors: K. M. Shakesheff, M. C. Davies, A. Domb, D. E. Jackson, C. J. Roberts, -The University of Nottingham
Publication: Macromolecules, 1995, 28. Date: 95
Title: Degrdtn of Thin Plymr Film Stdy by Simul in Situ AFM and Surf Plasmon Res A
Authors: X. Chen, K. M. Shakesheff, M. C. Davies, J. Heller, C. J. Roberts, -The University of Nottingham
Publication: Journal of Physical Chemistry 1995, 99 Date: 95
Title: Electric Force Microscope Probing Inside the Intel Pentium-Micro Processor
Authors: J. Sprengepiel, C. Bohm, E. Kubalek -University of Duisburg
Publication: Submitted to ESSIRC Conference 1995 France Date: 95
Title: Atomic Force Microscopy of Biological Cell Membranes From Cells to Molecule
Authors: M. Beckman, H. A. Kolb and F. Lang -University of Tubingen
Publication: Microscopy and Analysis Date: Jan 95
Title: The Initial Stages of Electrolytic Copper Deposition an Atomic View
Authors: T. Will, M. Dietterle and D. M. Kolb -University of Ulm
Publication: NATO-ASIVol E.288 Date: 95
Title: A Const Compliance Force Mod Tech for SFM Imaging of Polymer Surf Elasticit
Authors: E. W. Stroup, A. Pungor, V. Hlady -University of Utah
Publication: Submitted to Ultramicroscopy Date: Oct 95
Title: Release of Protein from a Poly (ortho ester) Film during Surface Erosion...
Authors: K. M. Shakesheff, M. C. Davies, J. Heller, C. J. Roberts, S. J. B. Tendler -University of Nottingham
Publication: Langmuir, Vol.11, No. 7 1995 Date: 95
Title: Scanning Probe Microscopes
Authors: Ittipol Jangchud, Alejandro M. Serrano, and Ronald K. Eby -University of Akron
Publication: Advanced Materials & Processes 7/95 Date: July 95
Title: AFM Investigation of Endothelial Fenestrae
Authors: F. Braet, W. H. J. Kalle, R. B. De Zanger, B. G. De Grooth A. K. Raap, -University of Brussels
Publication: Proc. Microscopy and Microanalysis 1995 Date: 95
Title: Comparative afm and sem mic: an invtgtn on fenestrated endo cells en vitro
Authors: F. Braet, W. H. J. Kalle, R. B. De Zanger, B. G. De Grooth A. K. Raap, -University of Brussels
Publication: Journal of Microscopy Vol. 180, Pt 3, Dec 1995 Date: December 95
Title: High-resolution magnetic imaging based on scanning probe techniques
Authors: U. Hartmann -University of Saarbrucken
Publication: J. Magn. Magn. Mat. Date: 95
Title: SCM and spectroscopy applied to local charge mod and char of NiO Si heteros
Authors: M. Dreyer, R. Wiesendanger -University of Hamburg
Publication: Appl Phys. A 61, 357-362 (1995) Date: 95
Title: Recent Advs in Nanostructl Invstgtns and Modifications of Solid Surfs by SP
Authors: Roland Wiesendanger -University of Hamburg
Publication: Jpn. J. Appl Phys. Vol. 34 (1995) pp. 3388-3395 Date: 95 June
Title: Atomic force microscopy of the cornea and sclera
Authors: Nigel Fullwood, Azzedine Hammiche, Hubert M. Pollock, Doug J. Hourston and -University of Lancaster
Publication: Oxford University Press Date: Feb 22, 95
Title: Excitonic Transitions in J-Aggregates Probed by (NSOM)
Authors: Daniel A. Higgins, Paul F. Barbara -University of Minnesota
Publication: J. Phys. Chem. 1995, 99, 3-7 Date: 95
Title: AFM Imaging Reveals Artifacts Produced by Commonly Used Analytical Methods
Authors: Veisfeld -California Institute of Technology
Publication: JMSA Vol. 1 No. 4 pp.163-166 1995 Date:
Title: In Situ Atomic Force Microscopy Imaging of Polymer Degradation in an Aqueou
Authors: K. M. Shakesheff -University of Nottingham
Publication: Langmuir 1994, 10 Date: 94
Title: Atomic Force Microscopy of Peritoneal Macrophages after Particle Phagocytos
Authors: M. Beckmann, H. A. Kolb, K. F. Lang -University of Tubingen
Publication: Journal of Membrane Biology 140, 197 Date: 94
Title: Scanning Probe Microscopy Depth Measurements of Self-Assembled Monolayer ..
Authors: Taejoon Han and Thomas P. Beebe -University of Utah
Publication: Langmuir 1994, 10, 2705-2709 Date: 94
Title: Imaging of Local Thermal and Electrical Conductivity with SPM
Authors: M Maywald, R. J. Pylkki, and L. J. Balk -University of Wuppertal
Publication: Scanning Microscopy Vol.8, No.2 1994 pages 181-188 Date: 94
Title: Using AFM to develop sub-µm multilevel metallization processes
Authors: Dipankar Pramanik, Milind Weling, Li Zhou -VLSI Technology
Publication: Advanced Instrumentation Date: July 94
Title: Applications of Atomic Force Microscopy to Quantifying Inter-Metal Dielec..
Authors: Milind Weling, Calvin Gabriel, and Subhas Bothra -VLSI Technology
Publication: VMIC Conference June 7-8 1994 ISMIC Date: June 94
Title: SXM-Methoden Nutzliche Werkzeuge fur die Praxis?
Authors: H. Fuchs -Wilhelms-Universitut Munster
Publication: Phys. Bl. 50 (1994) Nr.9 Date: 94
Title: Time Resolved Near Field Scanning optical Microscopy
Authors: C. Bohm, J. Bangert, W. Mertin, E. Kubalek -University of Duisburg
Publication: Journal of Physics (1) 1994 Date: 94
Title: Advanced Function and Failure Analysis of Monolithic Integrated Traveling
Authors: C. Bohm, A. Leyek, J. Sprengepiel, E. Kubalek -University of Duisburg
Publication: Proc of 24th EMC Cannes 1994 Date: 94
Title: Voltage Contrast Studies on .5µm Integrated Circuits by (SFM)
Authors: C. Bohm, A. Leyek, J. Sprengepiel, E. Kubalek -University of Duisburg
Publication: Proc of 5th ESREF, 1994 Date: 94
Title: Picosecond Electro-Optic Sampling System With Improved Spatial Resolution
Authors: C. Bohm, J. Bangert, W. Mertin and E. Kubalek -University of Duisburg
Publication: Proceedings of the 5th ESREF Glasgow 94 Date: 94
Title: Application of Fractal Fracture to Advanced Engine Material
Authors: Z. Chen, J. J. Mecholsky Jr., T. Joseph, and C. L. Beatty -University of Florida, Gainesville
Publication: 5th Intl Symposium on Ceramic Materials and Compon Date: July 94
Title: In Situ STM Study of Nickel Electrodeposition on HOPG
Authors: Zhenfang Chang, Jing Li, and Erkang Wang.
Publication: Journal Electranalytical Chemistry, 373 (1994) 83 Date: 1994
Title: Investigating the effect of secondary platen pressure on post-chemical-....
Authors: Iqbal Ali, Sudipto R. Roy, and Gregory B. Chinn, Srini Raghavan, Raj Shah.. -Texas Instruments
Publication: Microcontamination October 1994 Date: Oct 94
Title: Atomic Force Microscopy of Polymers Using Force Spectroscopy Modes
Authors: R. K. Eby, R. L. McEvoy, S. Marchese-Ragona -TopoMetrix
Publication: Porc. 52 Annual Mtg Microscopy Soc of America Date: 94
Title: Thermal Conductivity Contrast Imaging With a Scanning Thermal Microscope
Authors: R. B. Dinwiddie, R. Pylkki, and Paul West -TopoMetrix
Publication: Thermal Conductivity 22 Date: 94
Title: Advanced Diagnosis Techniques for Sub-µm Integrated Circuits
Authors: Solkner, Wolfgang, C. Bohm -University of Duisburg
Publication: Proc of 20th ESSCIRC, 1994 Date: 94
Title: Scanning Near-Field Optical Microscopy and Scanning Thermal Microscopy
Authors: R. Pylkki, Patrick J. Moyer, and Paul West -TopoMetrix
Publication: Jpn. J. Appl. Phys Vol 33(1994) 3785-90 Date: 94
Title: Atomic Force Imaging of Biological Molecules Using an Environmental Cell
Authors: Silvio P. Marchese-Ragona, Briggs Christie, Roland Bucher -TopoMetrix
Publication: Proc. 52st Meeting of the MSA Date: 94
Title: STM and LFM Investigation of the Structure and Characters of Conductive Polypyrrole Film
Authors: Jing Li, Erkang Wang.
Publication: Synthetic Metals, 66 (1994) 67 Date: 1994
Title: Image artifacts in non-contact mode afm - force delocalisation due to moist
Authors: B. Dinte, G. S. Watson, J. F. Dobson, and S. Myhra -Griffith University
Publication: Date:
Title: Force Constant Calibration of Atomic Force Microscope Probes
Authors: C. T. Gibson, G. S. Watson, and S. Myhra -Griffith University
Publication: Date:
Title: Imaging and Nano-Dissection of TMV by atomic force microscopy
Authors: G. R. Bushell, G. S. Watson, S. A. Holt and S. Myhra -Griffith University
Publication: Submitted to J. Microscopy Date:
Title: Self-Organization of Organic Liquids on Patterned Self-Assembled Monolayers
Authors: Hans A. Biebuyck and George M. Whitesides -Harvard University
Publication: Langmuir 1994, 10, 2790-2793 Date: 94
Title: Autophobic Pinning of Drops of Alkanethiols on Gold
Authors: Hans A. Biebuyck and George M. Whitesides -Harvard University
Publication: Langmuir 1994, 10, 4581-4587 Date: 94
Title: Glia: The Brain's Other Cells
Authors: J.W. Dani -Iowa State
Publication: Science Vol 266 Date: 11 Nov 94
Title: Study of the Long-Term Stiction problem in the Low Flying Height Magnetic D
Authors: A. S. Chekanov, T. S. Low -Magnetic Technology Center
Publication: International Tribology Conference -AUSTRIB 94 Date: Dec 94
Title: Atomic-Scale Resolution in Atomic Force Microscopy
Authors: F. Lin, D. Meier -Michigan Molecular Institute
Publication: Langmuir, 1994, 10. Date: 94
Title: In Situ AFM Imaging of Polymer Degradation in an Aqueous Environment
Authors: K. M. Shakesheff, M. C. Davies, C. J. Roberts, S. J. B. Tendler, A. G. Shar -The University of Nottingham
Publication: Langmuir, 1994, 10. Date: 94
Title: Scanning Probe Microscope Analysis of Optical Thin Films in a Manufacturing
Authors: S.P. Sapers, R. Clark, P Somerville -OCLI
Publication: presented at SVC Date: May 94
Title: Comparative Study of 3D measurement techniques (SPM, SEM, TEM) for sub micr
Authors: Henri R. J. R. van Helleputte, Theo B. J Haddeman, Martin J. Verheijen, Jan -Philips Research Laboratories
Publication: Date: 93 94 ?
Title: Thermal mapping of devices with a scanning probe microscope
Authors: Leigh Ann Files, Albert Taddiken, William Liu, James Wilson -Texas Instruments
Publication: TI Technical Report Date: July 22, 94
Title: Using the afm to measure roughness characteristics of Acetabular Prosthetic
Authors: Gary Williams, Shilseh Jani, Silvio P. Marchese-Ragona -TopoMetrix
Publication: Surfaces in Biomaterials 94 Date: 94
Title: Electrochemical Applications of Scanning Probe Microscopy
Authors: Michael Green -TopoMetrix
Publication: Materials Technology Date: May / June 94
Title: Problems in temperature control performing in situ investigations with (SFM
Authors: S. Kipp, R. Lacmann, M. A. Schneeweiss -Universitat Braunschweig, Germany
Publication: Ultramicroscopy Date: 94
Title: Methods and Apparatus for in situ investigations with (SFM)
Authors: S. Kipp, R. Lacmann, M. A. Schneeweiss -Universitat Braunschweig, Germany
Publication: Journal of Crystal Growth 141 (1994) 291-298 Date: 94
Title: Imaging Crystal Growth Features Using Scanning Force Microscopy (SFM)
Authors: S. Kipp, S. Kaemmer, R. Lacmann, J. Rolfs, U. Tanneberger, W. Beckman -Universitat Braunschweig, Germany
Publication: Cryst. Res. Technol. 29 1994 7 1005-1011 Date: 94
Title: Imaging Crystal Growth Features Using Scanning Force Microscopy (SFM)
Authors: S. Kipp, R. Lacmann, M. A. Schneeweiss -Universitat Braunschweig, Germany
Publication: Cryst. Res. Technol. 29 1994 7 1005-1011 Date: 94
Title: Characterization of Rapid Thermally Grown Dielectrics by Surface Charge Ana
Authors: John M. Grant -Sharp Microelectronics Technology
Publication: Proc of 3rd Intl Symp on Process Phys and Modeling Date: June 93
Title: Topography and performance of Gas-Sensing Devices: an AFM Study
Authors: Birgitta Hacker, Maximilian Fleischer, Hans Meixner -Siemens AG
Publication: Scanning Vol. 15, 291-294 (1993) Date: June, 93
Title: Diamonds at Stanford: A new technology for the semiconductor Industry?
Authors: -Stanford
Publication: Solid State Technology Date: May 93
Title: ECSTM In Situ Study of the Electropolymerized Mechanism of Pyrrole on HOPG
Authors: Jing Li, Erkang Wang.
Publication: Chemical Journal of Chinese Universities, 14 (1993) 1227 (chinese) Date: 1993
Title: Applications of SFM in the Chemical Industry
Authors: M. Anders, H. Fuchs -BASF AG, Polymer Research Lab
Publication: Scanning Vol. 15, 275-281 (1993) Date: 93
Title: Lateral Forces During Atomic Force Microscopy of Graphite in Air
Authors: David R. Baselt, John D. Baldeschwieler -Cal Tech
Publication: Date:
Title: Atomic Force Microscopy: A Tool For Analyzing Coatings
Authors: F. Lin, D. Meier, D Hoyt, T. Van Slambrouck, J. Leckenby -Michigan Molecular Institute
Publication: Materials World Date: July 93
Title: STM and AFM Semiconductor Applications
Authors: Leigh Ann Files-Sesler -Texas Instruments
Publication: TI Technical Report Date:
Title: Cooling crystallization experiments observed by in situ sfm
Authors: S. Kipp, R. Lacmann -Universitat Braunschweig, Germany
Publication: Date:
Title: Investigation of Nanoparticles by Atomic and lateral Force Microscopy
Authors: R. Wurster and B. Ocker -Universitat Hohenheim
Publication: Scanning Vol. 15, 130-135 Date: Dec 93
Title: Investigations of Artificial Nanostructures and Lithography Techniques(SPM)
Authors: U. A. Griesinger, C. Kaden, N. Lichtenstein, J. Hommel, G. Lehr, R. Bergman -Universitat Stuttgart Pfaffenwaldring
Publication: Phys. Institut, Uni Stuttgart Date: 93
Title: Electron-flux induced growth of microcrystalline germanium by ECR plasma
Authors: T. Aoki, Y. Nishikawa, K. Fukasawa, W. Q. Sheng, M. Hirose -Tokyo Institute of Polytechnics
Publication: Journal of Non-Crystalline Solids164-166 (1993) 91 Date: 93
Title: Biological Applications For SPM
Authors: D. C. Cullen, G. McKerr & E. M. Hughes -University of Cambridge
Publication: Microscopy and Analysis Date: Sept 93
Title: Corrosion studies using an electrochemical scanning force microscope
Authors: Michael Green -TopoMetrix
Publication: American Laboratory Date: April 93
Title: Atomic Force Imaging of Biological Molecules Using an Environmental Cell
Authors: Silvio P. Marchese-Ragona, Briggs Christie, Renee Jobe -TopoMetrix
Publication: Proc. 51st Meeting of the MSA Date: 93
Title: Operating Modes in Scanning Probe Microscopy
Authors: Stefan Kaemmer and Stefan Gehring -TopoMetrix
Publication: 45th annual meeting of the Scandinavian Soc for EM Date: 93
Title: Surface roughness analysis by scanning tunneling microscopy and afm
Authors: Leigh Ann Files, Tim Hogan and Tomoaki Taguchi -Texas Instruments
Publication: J. Vac. Sci. Technol. Jul/Aug 1992 Date: 92
Title: Scanning tunneling microscopy: Critical Dimension and surface roughness...
Authors: Leigh Ann Files-Sesler, John N. Randall, and David Harkness -Texas Instruments
Publication: J. Vac. Sci. Technol. B 9 (2) Mar/Apr 1991 Date: 91
Title: Scanning tunneling microscopy: Critical dimension and surface roughness ana
Authors: Leigh Ann Files-Sesler, John N. Randall, and David Harkness -Texas Instruments
Publication: J. Vac. Sci. Technol. B 9 (2) Date: Mar/Apr 91