EXPLORER's is a totally new concept in Scanning Probe Microscope (SPM) design. It incorporates TopoMetrix' Scanning Tip Technology, a unique feature that permits imaging samples of any diameter, thickness or mass. This TopoMetrix-exclusive design also makes it possible to perform contact, non-contact, lateral force, force modulation and other Atomic Force Microscopy (AFM) techniques without any hardware changes.
EXPLORER's modular construction makes it possible to scan in virtually every SPM mode, including lateral force microscopy (LFM), scanning tunneling microscopy (STM), as well as in those modes where samples are immersed in liquids and during electrochemical reactions.
EXPLORER is controlled by TopoMetrix' proven Electronic Control System (ECU-plus). It includes a Pentium 133 MHz workstation, DSP based image acquisition, and the industry's most powerful display and analysis software. Open architecture permits interfacing with external feedback signals and accessing data collection channels through standard BNC connectors. This expanded flexibility makes it convenient for users to modify the system for unique SPM experiments.
EXPLORER's design combines operating flexibility, application versatility and extensive provisions for future growth in one SPM instrument.
EXPLORER offers every important operating feature and convenience. Its design is optimized for simplicity, functionality and reliability. Significant operating characteristics include:
Premounted and fully inspected AFM cantilever and tip assemblies.
Convenient imaging site selection with an integrated 200X optical microscope.
Explorer SuperTranslator, computer controlled with Step-and-Scan, integrated vibration isolation, and 7mm x 7mm translation on samples up to 5 cm in diameter.
SPMLab software and drivers for all windows compatible printers.
TrueMetrixlinearized scanning system
As with all TopoMetrix instruments, full on-site installation and user training are provided for each EXPLORER system, and every EXPLORER is equipped with all of the components and tools required to conduct meaningful AFM analyses. A full complement of options and accessories is available, making it possible to take full advantage of all available probe techniques
Integral 200X optical microscope, CCD camera and monitor
100Ám X-Y and 12 Ám Z scanners, fully linearized
Pentium 133 MHz workstation with minimum 1.2Gbyte hard drive and 32 Mbyte RAM
ECU-plus, DSP-based electronic control unit with open architecture
EXPLORER combines full AFM capability, simple operation, and configuration flexibility in a single instrument that is priced significantly below other comparably equipped AFMs.
*A patent application that covers this unique concept has been filed with the U.S. and foreign Patent Offices.