Investigations of Liquid Crystals and Liquid Ambients using Near-field Scanning Optical Microscopy

Investigations of Liquid Crystals and Liquid Ambients using Near-field Scanning Optical Microscopy

Patrick J. Moyer (1), Stefan Kämmer (2), Karsten Walzer (3), Michael Hietschold (3)
(1) University of North Carolina, Charlotte (UNCC); (2) TopoMetrix Corp., Santa Clara, CA; (3) Institut für Physik, Technische Universtät Chemnitz-Zwickau, D-09107 Chemnitz, Germany

Excerpts from an article in: ULTRAMICROSCOPY 61 (1995) 291-294

Click image for closer look (37k)

Simultaneously acquired reflection-mode polarization NSOM (left image) and shear force topography image (right). Dark regions of the left NSOM image represent areas that were modified by three previous scans.

Conditions:

Reflection mode NSOM on AURORA
Cross-polarization Microscopy
Liquid crystal thickness is approximately 300nm
Feedback on air-liquid interface
Dark regions in NSOM image were previously scanned areas
Material modified optically but not topographically
Localized modification is a result of light or heat from the NSOM probe

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